Precision Near-Field Detection for EMC Diagnostics
The Y.I.C. Near Field Probe Kit is a professional EMI diagnostic solution designed for precise PCB-level emission detection and troubleshooting. It enables engineers to identify and localize electromagnetic interference sources directly on printed circuit boards before formal compliance testing.
Engineered for use in R&D labs and EMC environments, the kit supports efficient debugging of radiated emissions in high-speed digital, RF, and power electronic systems.
Product Highlights
Complete E-Field and H-Field Probe Selection
H-field (magnetic field) probes for current loop and switching noise detection
E-field (electric field) probes for voltage-driven emission sources
Multiple probe geometries for different spatial resolutions
Optimized for close-proximity PCB scanning
The combination of E-field and H-field probes allows comprehensive EMI source analysis.
High-Frequency EMI Diagnostics
PCB-level emission localization
Switching power supply noise detection
High-speed clock and data line investigation
RF emission hotspot identification
Shielding and grounding validation
The probe kit supports systematic EMI root-cause analysis during development.
Flexible Laboratory Integration
Compatible with spectrum analyzers
Suitable for EMI receivers
Usable with oscilloscopes for time-domain analysis
Ideal complement to Y.I.C. EMScanner systems
Provides both qualitative and quantitative EMI diagnostics depending on the connected measurement instrument.
Key Capabilities at a Glance
Near-field electromagnetic emission detection
Electric and magnetic field analysis
High spatial resolution PCB scanning
Compact and precise probe construction
Professional-grade EMC troubleshooting tool
Ideal For
EMC / EMI engineers PCB design engineers Power electronics developers RF design teams Automotive electronics engineers Research and development laboratories
The Y.I.C. Near Field Probe Kit delivers reliable and precise EMI source localization at PCB level ” helping engineers accelerate debugging, reduce compliance risk, and improve EMC performance before chamber testing.
Set of 5 Electric and Magnetic probes, 5-50mm USB Camera and mechanical arm.
HXY 10A02: 10 MHz ” 350 MHz
HXY 20A02: 100 MHz ” 1.4 GHz
HZ 40A02: 1 GHz ” 14 GHz
HXY 60A01: 1 GHz ” 13 GHz
E 00A02: 1.6 GHz ” 18 GHz
USB 5MP x10 Optical Zoom Camera
1YR EMViewer Subscription including upgrades, support & hardware warranty.
Why Choose the Near Field Probe Kit?
The Near Field Probe Kit is built to deliver unmatched reliability and accuracy in the most demanding environments. Designed for engineers who prioritize performance, this unit ensures stable results for R&D, quality assurance, and industrial maintenance. Contact us today for personalized technical support and bulk inquiries.
Near Field Probe Kit
CHF 1'260.00
excl. VAT
Precision Near-Field Detection for EMC Diagnostics
Description
Professional EMI Troubleshooting Set
Precision Near-Field Detection for EMC Diagnostics
The Y.I.C. Near Field Probe Kit is a professional EMI diagnostic solution designed for precise PCB-level emission detection and troubleshooting. It enables engineers to identify and localize electromagnetic interference sources directly on printed circuit boards before formal compliance testing.
Engineered for use in R&D labs and EMC environments, the kit supports efficient debugging of radiated emissions in high-speed digital, RF, and power electronic systems.
Product Highlights
Complete E-Field and H-Field Probe Selection
H-field (magnetic field) probes for current loop and switching noise detection
E-field (electric field) probes for voltage-driven emission sources
Multiple probe geometries for different spatial resolutions
Optimized for close-proximity PCB scanning
The combination of E-field and H-field probes allows comprehensive EMI source analysis.
High-Frequency EMI Diagnostics
PCB-level emission localization
Switching power supply noise detection
High-speed clock and data line investigation
RF emission hotspot identification
Shielding and grounding validation
The probe kit supports systematic EMI root-cause analysis during development.
Flexible Laboratory Integration
Compatible with spectrum analyzers
Suitable for EMI receivers
Usable with oscilloscopes for time-domain analysis
Ideal complement to Y.I.C. EMScanner systems
Provides both qualitative and quantitative EMI diagnostics depending on the connected measurement instrument.
Key Capabilities at a Glance
Near-field electromagnetic emission detection
Electric and magnetic field analysis
High spatial resolution PCB scanning
Compact and precise probe construction
Professional-grade EMC troubleshooting tool
Ideal For
EMC / EMI engineers
PCB design engineers
Power electronics developers
RF design teams
Automotive electronics engineers
Research and development laboratories
The Y.I.C. Near Field Probe Kit delivers reliable and precise EMI source localization at PCB level ” helping engineers accelerate debugging, reduce compliance risk, and improve EMC performance before chamber testing.
Set of 5 Electric and Magnetic probes, 5-50mm USB Camera and mechanical arm.
Why Choose the Near Field Probe Kit?
The Near Field Probe Kit is built to deliver unmatched reliability and accuracy in the most demanding environments. Designed for engineers who prioritize performance, this unit ensures stable results for R&D, quality assurance, and industrial maintenance. Contact us today for personalized technical support and bulk inquiries.
Available Technical Documents
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