Description

Professional EMI Troubleshooting Set

Precision Near-Field Detection for EMC Diagnostics

The Y.I.C. Near Field Probe Kit is a professional EMI diagnostic solution designed for precise PCB-level emission detection and troubleshooting. It enables engineers to identify and localize electromagnetic interference sources directly on printed circuit boards before formal compliance testing.

Engineered for use in R&D labs and EMC environments, the kit supports efficient debugging of radiated emissions in high-speed digital, RF, and power electronic systems.

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Product Highlights

Complete E-Field and H-Field Probe Selection

• H-field (magnetic field) probes for current loop and switching noise detection

• E-field (electric field) probes for voltage-driven emission sources

• Multiple probe geometries for different spatial resolutions

• Optimized for close-proximity PCB scanning

The combination of E-field and H-field probes allows comprehensive EMI source analysis.

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High-Frequency EMI Diagnostics

• PCB-level emission localization

• Switching power supply noise detection

• High-speed clock and data line investigation

• RF emission hotspot identification

• Shielding and grounding validation

The probe kit supports systematic EMI root-cause analysis during development.

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Flexible Laboratory Integration

• Compatible with spectrum analyzers

• Suitable for EMI receivers

• Usable with oscilloscopes for time-domain analysis

• Ideal complement to Y.I.C. EMScanner systems

Provides both qualitative and quantitative EMI diagnostics depending on the connected measurement instrument.

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Key Capabilities at a Glance

• Near-field electromagnetic emission detection

• Electric and magnetic field analysis

• High spatial resolution PCB scanning

• Compact and precise probe construction

• Professional-grade EMC troubleshooting tool

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Ideal For

EMC / EMI engineers
PCB design engineers
Power electronics developers
RF design teams
Automotive electronics engineers
Research and development laboratories

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The Y.I.C. Near Field Probe Kit delivers reliable and precise EMI source localization at PCB level ” helping engineers accelerate debugging, reduce compliance risk, and improve EMC performance before chamber testing.

Set of 5 Electric and Magnetic probes, 5-50mm USB Camera and mechanical arm.

• HXY 10A02: 10 MHz ” 350 MHz
• HXY 20A02: 100 MHz ” 1.4 GHz
• HZ 40A02: 1 GHz ” 14 GHz
• HXY 60A01: 1 GHz ” 13 GHz
• E 00A02: 1.6 GHz ” 18 GHz
• USB 5MP x10 Optical Zoom Camera
• 1YR EMViewer Subscription including upgrades, support & hardware warranty.

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Why Choose the Near Field Probe Kit?

The Near Field Probe Kit is built to deliver unmatched reliability and accuracy in the most demanding environments. Designed for engineers who prioritize performance, this unit ensures stable results for R&D, quality assurance, and industrial maintenance. Contact us today for personalized technical support and bulk inquiries.