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EMS08R
CHF 47'615.00
excl. VAT
EMScanner high-resolution EMI scanner for precise PCB-level emission diagnostics.
Description
Automated Radiated EMI Diagnostic System for PCB-Level Analysis
The Y.I.C. EMScannerR is a high-resolution near-field radiated emission scanning system engineered for EMC engineers and hardware development teams requiring precise PCB-level EMI diagnostics. It provides automated spatial emission mapping to support radiated pre-compliance evaluation prior to accredited chamber testing. Designed for advanced R&D environments, the system enables quantitative and repeatable analysis of radiated emissions directly at the source.
Measurement Principle
The EMScannerR utilizes a high-density near-field probe array combined with automated X-Y scanning to capture electromagnetic emissions across the PCB surface. The measured near-field data is correlated to radiated emission behavior in accordance with pre-compliance methodologies. This approach enables:
Technical Capabilities
The system supports engineering-level EMI root cause analysis rather than simple pass/fail evaluation.
Advanced Data Visualization
This allows precise identification of problematic layout regions, shielding weaknesses, and return current discontinuities.
Application Scope
Benefits for EMC Engineers
The Y.I.C. EMScannerR is a precision diagnostic platform for engineers who require detailed spatial emission analysis and systematic EMI root-cause identification before formal compliance testing.
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Why Choose the EMS08R?
The EMS08R is built to deliver unmatched reliability and accuracy in the most demanding environments. Designed for engineers who prioritize performance, this unit ensures stable results for R&D, quality assurance, and industrial maintenance. Contact us today for personalized technical support and bulk inquiries.
Available Technical Documents
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